IEC 61000-4-29:2000 ED1

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Publication date: Aug 30, 2000

General information

Current stage: 60.60 Effective date: Aug 30, 2000

Originator: IEC

Owner: TC 77/SC 77A

Type: International Standard

ICS: 33.100.20

Languages: English French Spanish

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Status: Published

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Scope

Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.

Life cycle

NOW

PUBLISHED
IEC 61000-4-29:2000 ED1
60.60 Standard published
Aug 30, 2000

REVISED BY

IN_DEVELOPMENT
IEC 61000-4-29 ED2