IEC 61000-4-29 ED2

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Scope

IEC 61000-4-29: 2026 defines test methods for immunity to voltage dips, short interruptions and voltage variations at the DC input power port of electrical or electronic equipment. This document is applicable to equipment and systems whose DC input power ports are intended to be connected to low voltage DC networks external to the equipment and systems. The object of this document is to establish a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on DC input power ports.
This document defines:
- the range of test levels;
- the test generator;
- the test set-up;
- the test procedure.
The test described hereinafter applies to electrical and electronic equipment and systems. It also applies to modules or subsystems whenever the equipment under test’s (EUT) rated power is greater than the test generator capacity specified in Clause 6. The ripple at the DC input power port is not included in the scope of this document. It is covered by IEC 61000‑4‑17. This document does not specify the tests to be applied to particular apparatus or systems. Its main aim is to give a general basic reference to IEC product committees. These product committees (or users and manufacturers of equipment) remain responsible for the appropriate choice of the tests and the severity level to be applied to their equipment.
This second edition cancels and replaces the first edition published in 2000. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) Increase of the output voltage of the test generator to take into account new DC networks voltages;
b) provision of tolerances for the duration of the voltage changes;
c) limitation of the current when applying short interruptions in low impedance condition;
d) general technical clarifications for the specifications of the test generator and their verification;
e) clarifications regarding the loads used to verify the switching characteristics and the peak inrush current drive capability of the test generator;
f) clarifications regarding the evaluation of test results and test reports;
g) description of the DC environment.