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IEC 60747-14-2:2000 ED1

Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

Nov 9, 2000

General information

60.60     Nov 9, 2000

IEC

TC 47/SC 47E

International Standard

31.080.99  

English  

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Scope

Provides standards for packaged semiconductor Hall elements which utilize the Hall effect.

Life cycle

NOW

PUBLISHED
IEC 60747-14-2:2000 ED1
60.60 Standard published
Nov 9, 2000

National adoptions

SSH IEC 60747-14-2:2000  
DPS

Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

60.60 Standard published

DPS/KT 7 more