DPS
Drejtoria e Përgjithshme e Standardizimit
0 Items
My account
E-albania
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
Main menu

IEC 60747-18-1:2019 ED1

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

May 20, 2019

General information

60.60     May 20, 2019

IEC

TC 47/SC 47E

International Standard

31.080.99  

English  

Buying

Published

Language in which you want to receive the document.

Scope

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

Life cycle

NOW

PUBLISHED
IEC 60747-18-1:2019 ED1
60.60 Standard published
May 20, 2019

National adoptions

SSH IEC 60747-18-1:2019  
DPS

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

60.60 Standard published

DPS/KT 7 more