IEC 62899-402-1:2017 ED1

Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

Publication date: Mar 3, 2017

General information

Current stage: 60.60 Effective date: Mar 3, 2017

Originator: IEC

Owner: TC 119

Type: International Standard

ICS: 31.180

Languages: English

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Status: Published

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Scope

IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

Life cycle

NOW

PUBLISHED
IEC 62899-402-1:2017 ED1
60.60 Standard published
Mar 3, 2017

REVISED BY

IN_DEVELOPMENT
IEC 62899-402-1 ED2