Revised
IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.
The contents of the corrigendum of September 2017 have been included in this copy.
WITHDRAWN
IEC 60539-1:2008 ED2
WITHDRAWN
IEC 60539-1:2016 ED3
99.60
Withdrawal effective
Dec 15, 2022
WITHDRAWN
IEC 60539-1:2016/COR1:2017 ED3
PUBLISHED
IEC 60539-1:2022 ED4