Revised
IEC 60539-1:2008 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
WITHDRAWN
IEC 60539-1:2002 ED1
WITHDRAWN
IEC 60539-1:2008 ED2
99.60
Withdrawal effective
Apr 27, 2016
WITHDRAWN
IEC 60539-1:2016 ED3