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IEC 62258-5:2006 ED1

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

Aug 29, 2006

General information

60.60     Aug 29, 2006

IEC

TC 47

International Standard

31.080.99  

English   French  

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Scope

IEC 62258-5:2006 has been developed to facilitate the production, supply and use of semiconductor die products, including:
- wafers;
- singulated bare die;
- die and wafers with attached connection structures;
- minimally or partially encapsulated die and wafers.
This part of IEC 62258 specifies the information required to facilitate the use of electrical data and models for simulation of the electrical behaviour and verification of the correct functionality of electronic systems that include bare semiconductor die, with or without connection structures, and/or minimally packaged semiconductor die. It is intended to assist all those involved in the supply chain for die devices to comply with the requirements of IEC 62258-1 and IEC 62258-2.

This publication is to be read in conjunction with IEC 62258-1:2009 and IEC 62258-2:2011.

Life cycle

NOW

PUBLISHED
IEC 62258-5:2006 ED1
60.60 Standard published
Aug 29, 2006