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IEC 60748-4-3:2006 ED1

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

Aug 29, 2006

General information

60.60     Aug 29, 2006

IEC

TC 47/SC 47A

International Standard

31.200  

English  

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Scope

Specifies a set of measuring methods and requirements for testing
ADCs under dynamic conditions, together with associated terminology and characteristics

Life cycle

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PUBLISHED
IEC 60748-4-3:2006 ED1
60.60 Standard published
Aug 29, 2006

National adoptions

SSH IEC 60748-4-3:2006  
DPS

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

60.60 Standard published

DPS/KT 7 more