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SSH IEC 60748-4-3:2006

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

Dec 10, 2010

General information

60.60     Jan 1, 2006

DPS

DPS/KT 7

International Standard

31.200  

English  

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Scope

Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics

Life cycle

NOW

PUBLISHED
SSH IEC 60748-4-3:2006
60.60 Standard published
Jan 1, 2006

Related project

Adopted from IEC 60748-4-3:2006 ED1 IDENTICAL

Adopted from IEC 60748-4-3 Ed. 1.0 en