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IEC 63364-1:2022 ED1

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

Dec 14, 2022

General information

60.60     Dec 14, 2022

IEC

TC 47

International Standard

31.080.99  

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Scope

IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

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PUBLISHED
IEC 63364-1:2022 ED1
60.60 Standard published
Dec 14, 2022