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IEC 60747-18-4:2023 ED1

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

Mar 16, 2023

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60.60     Mar 16, 2023

IEC

TC 47/SC 47E

International Standard

31.080.99  

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IEC 60747-18-4:2023(E) specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.

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PUBLISHED
IEC 60747-18-4:2023 ED1
60.60 Standard published
Mar 16, 2023

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SSH IEC 60747-18-4:2023 ED1  
DPS

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

60.60 Standard published

DPS/KT 7 more