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IEC PAS 62186:2000 ED1

Mechanical shock test method

Aug 24, 2000
95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99     Jul 1, 2002

IEC

TC 47

Publicly Available Specification

31.080.01  

English  

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Replaced

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Scope

This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. It is normally applicable to cavity-type packages.

Life cycle

NOW

WITHDRAWN
IEC PAS 62186:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

WITHDRAWN
IEC 60749-10:2002 ED1