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IEC 60747-5-14 ED1

Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

General information

40.99     Aug 27, 2021

DECFDIS    Nov 30, 2021

IEC

TC 47/SC 47E

International Standard

31.080.99  

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-5-14 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
Aug 27, 2021

National adoptions

prSSH IEC 60747-5-14:2022 ED1:2024  
DPS

Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

40.60 Close of voting

DPS/KT 7 more

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