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IEC 62951-8:2023 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

Jan 19, 2023

General information

60.60     Jan 19, 2023

IEC

TC 47

International Standard

31.080.99  

English  

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Scope

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.

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PUBLISHED
IEC 62951-8:2023 ED1
60.60 Standard published
Jan 19, 2023