DPS
Drejtoria e Përgjithshme e Standardizimit
0 Items
My account
E-albania
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
Main menu

IEC 62373-1:2020 ED1

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Jul 15, 2020

General information

60.60     Jul 15, 2020

IEC

TC 47

International Standard

31.080.30  

English   French  

Buying

Published

Language in which you want to receive the document.

Scope

IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).
This document also defines the terms pertaining to the conventional BTI test method.

Life cycle

NOW

PUBLISHED
IEC 62373-1:2020 ED1
60.60 Standard published
Jul 15, 2020