DPS
Drejtoria e Përgjithshme e Standardizimit
0 Items
My account
E-albania
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
Main menu

SSH EN 60749-2:2002

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

Dec 18, 2006

General information

60.60     Jan 1, 2006

DPS

DPS/KT 4

European Norm

31.080.01  

English  

Buying

Published

Language in which you want to receive the document.

Scope

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.

Life cycle

NOW

PUBLISHED
SSH EN 60749-2:2002
60.60 Standard published
Jan 1, 2006

Related project

Adopted from EN 60749-2:2002

Adopted from IEC 60749-2 Ed. 1.0 b