prDS IEC TS 62878-2-4:2015 ED1

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

General information

Current stage: 40.60 Effective date: May 11, 2026

Next stage: 60.60

Originator: DPS

Owner: DPS/KT 8

Type: Technical Specification

ICS: 31.180 31.190

Scope

IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Life cycle

NOW

IN_DEVELOPMENT
prDS IEC TS 62878-2-4:2015 ED1
40.60 Close of voting
May 11, 2026

prDS IEC TS 62878-2-4:2015 ED1

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

General information

Scope

Life cycle

NOW

Related project

Adopted from IEC TS 62878-2-4:2015 ED1 IDENTICAL