IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
Only informative sections of projects are publicly available. To view the full content, you will need to create an account. If you are a member, please log in to your account by clicking on the "Log in" button.
Shqip