SSH EN IEC 61189-2-720:2024

Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-720: Detection of defects in interconnection structures by measurement of capacitance

Publication date: Jun 26, 2025

General information

Current stage: 60.60 Effective date: Jun 26, 2025

Next stage: 95.99

Originator: DPS

Owner: DPS/KT 8

Type: European Norm

ICS: 31.180

Languages: English

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Status: Published

PDF - ALL 2,677

Paper - ALL 2,677

CD - ALL 2,677

PDF and Paper - ALL 5,354

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IEC 61189-2-720:2024 provides a method to evaluate specific characteristics of circuit boards by measuring the capacitance between conductor traces and a ground plane and can be used for qualitative comparison of a test specimen to a reference board. This method is not intended for quantitative measurements and for assessment of conformity to a specification.

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PUBLISHED
SSH EN IEC 61189-2-720:2024
60.60 Standard published
Jun 26, 2025

SSH EN IEC 61189-2-720:2024

Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-720: Detection of defects in interconnection structures by measurement of capacitance

General information

Buying

Scope

Life cycle

NOW

Related project

Adopted from EN IEC 61189-2-720:2024 IDENTICAL

Adopted from IEC 61189-2-720:2024 ED1 IDENTICAL