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SSH IEC 62878-1-1:2015 ED1

Device embedded substrate - Part 1-1: Generic specification - Test methods

Oct 12, 2022

General information

60.60     Oct 12, 2022

95.99   

DPS

DPS/KT 8

International Standard

31.180     31.190     31.18     31.19  

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Scope

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

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PUBLISHED
SSH IEC 62878-1-1:2015 ED1
60.60 Standard published
Oct 12, 2022

Related project

Adopted from IEC 62878-1-1:2015 ED1