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SSH IEC 62047-40:2021 ED1

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

Jun 23, 2022

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60.60     Jun 23, 2022

95.99   

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DPS/KT 7

International Standard

31.080.99  

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Scope

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

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PUBLISHED
SSH IEC 62047-40:2021 ED1
60.60 Standard published
Jun 23, 2022

Related project

Adopted from IEC 62047-40:2021 ED1