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SSH EN IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Apr 26, 2021

General information

60.60     Apr 26, 2021

95.99    May 1, 2026

DPS

DPS/KT 7

European Norm

31.080.01  

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IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

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SSH EN IEC 60749-41:2020
60.60 Standard published
Apr 26, 2021

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Adopted from EN IEC 60749-41:2020 IDENTICAL

Adopted from IEC 60749-41:2020 ED1 IDENTICAL