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SSH IEC 62951-6:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

Apr 21, 2020

General information

60.60     Feb 12, 2020

DPS

DPS/KT 7

Pure national standard

31.080.99  

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Scope

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

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PUBLISHED
SSH IEC 62951-6:2019
60.60 Standard published
Feb 12, 2020

Related project

Adopted from IEC 62951-6:2019 ED1 IDENTICAL