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SSH IEC 62951-2:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

Apr 21, 2020

General information

60.60     Feb 12, 2020

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DPS/KT 7

Pure national standard

31.080.99  

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Scope

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin‑film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.

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PUBLISHED
SSH IEC 62951-2:2019
60.60 Standard published
Feb 12, 2020

Related project

Adopted from IEC 62951-2:2019 ED1 IDENTICAL