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SSH EN IEC 60749-12:2018

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Apr 11, 2019

General information

60.60     Jan 28, 2019

DPS

DPS/KT 7

European Norm

31.080.01  

English  

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Scope

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages

This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:

a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Life cycle

PREVIOUSLY

WITHDRAWN
SSH IEC 60749-12:2002

WITHDRAWN
SSH IEC 60749-12:2002/COR1:2003

NOW

PUBLISHED
SSH EN IEC 60749-12:2018
60.60 Standard published
Jan 28, 2019

Related project

Adopted from EN IEC 60749-12:2018

Adopted from IEC 60749-12:2017 ED2