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SSH IEC 60749-12:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Nov 25, 2011
95.99 Withdrawal of Standard   May 7, 2019

General information

95.99     May 7, 2019

DPS

DPS/KT 7

International Standard

31.080.01  

English  

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Scope

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

NOW

WITHDRAWN
SSH IEC 60749-12:2002
95.99 Withdrawal of Standard
May 7, 2019

REVISED BY

PUBLISHED
SSH EN IEC 60749-12:2018

Related project

Adopted from IEC 60749-12 Ed. 1.0 b