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SSH IEC 60748-20-1:1994

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

Nov 16, 2016

General information

60.60     Jul 11, 2016

DPS

DPS/KT 7

International Standard

31.200  

English  

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Scope

The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.

Life cycle

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PUBLISHED
SSH IEC 60748-20-1:1994
60.60 Standard published
Jul 11, 2016

Related project

Adopted from IEC 60748-20-1:1994 ED1 IDENTICAL

Adopted from IEC 60748-20-1 Ed. 1.0 b