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SSH ISO 15932:2013

Microbeam analysis — Analytical electron microscopy — Vocabulary

Nov 16, 2016

General information

60.60     Jul 12, 2016

DPS

DPS/KT 233

International Standard

37.020     01.040.37  

English  

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Scope

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

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PUBLISHED
SSH ISO 15932:2013
60.60 Standard published
Jul 12, 2016

Related project

Adopted from ISO 15932:2013