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SSH EN 62878-1-1:2015

Device embedded substrate - Part 1-1: Generic specification - Test methods

Apr 29, 2016

General information

60.60     Mar 1, 2016

DPS

DPS/KT 4

European Norm

31.180     31.190  

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Scope

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

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PUBLISHED
SSH EN 62878-1-1:2015
60.60 Standard published
Mar 1, 2016

Related project

Adopted from EN 62878-1-1:2015

Adopted from IEC 62878-1-1 Ed. 1.0 b