SSH EN 60749-29:2003

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Publication date: Aug 30, 2006

95.99 Withdrawal of Standard Dec 17, 2014

General information

Current stage: 95.99 Effective date: Dec 17, 2014

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080

Languages: English

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Status: Withdrawn

PDF - ALL 3,391

Paper - ALL 3,391

CD - ALL 3,391

PDF and Paper - ALL 6,782

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Scope

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing No Trouble Found and Electrical Overstress failures due to latch-up.

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WITHDRAWN
SSH EN 60749-29:2003
95.99 Withdrawal of Standard
Dec 17, 2014

SSH EN 60749-29:2003

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

95.99 Withdrawal of Standard Dec 17, 2014

General information

Buying

Scope

Life cycle

NOW

REVISED BY

Related project

Adopted from EN 60749-29:2003

Adopted from IEC 60749-29 Ed. 1.0 b