SSH ISO 6442:2005

Door leaves — General and local flatness — Measurement method

Publication date: May 18, 2015

General information

Current stage: 60.60 Effective date: May 18, 2015

Originator: DPS

Owner: DPS/KT 175

Type: International Standard

ICS: 91.060.50

Languages: English

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Status: Published

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Scope

ISO 6442:2005 can be applied to all rectangular door leaves.
ISO 6442:2005 specifies the method to be used to measure the deviations in general and local flatness of door leaves.
In ISO 6442:2005, the concept of local flatness deviation is limited to defects considered to be prejudicial to the appearance of the door leaf.

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SSH ISO 6442:2000

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PUBLISHED
SSH ISO 6442:2005
60.60 Standard published
May 18, 2015

SSH ISO 6442:2005

Door leaves — General and local flatness — Measurement method

General information

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Scope

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Related project

Adopted from ISO 6442:2005