IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Z<sub>s</sub>) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Z<sub>s</sub> at the resonant frequency f<sub>0</sub>.
PUBLISHED
SSH EN 61788-15:2011
60.60
Standard published
May 27, 2013
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