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SSH EN 60512-25-6:2004

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Dec 18, 2006

General information

60.60     Jan 1, 2008

DPS

DPS/KT 4

European Norm

31.220.10  

English  

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Scope

Describes methods for measuring an eye pattern response and jitter in the time domain.

Life cycle

NOW

PUBLISHED
SSH EN 60512-25-6:2004
60.60 Standard published
Jan 1, 2008

Related project

Adopted from EN 60512-25-6:2004

Adopted from IEC 60512-25-6 Ed. 1.0 b