SSH EN 12698-2:2007

Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods

Publication date: Oct 24, 2011

General information

Current stage: 60.60 Effective date: Oct 24, 2011

Originator: DPS

Owner: DPS/KT 47

Type: European Norm

ICS: 71.040.40

Languages: English

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Status: Published

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Scope

This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.
It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of -Si3N4, -Si3N4, Si2ON2, AlN, and SiAlON are described.
NOTE For the refinement procedures the total nitrogen content, analysed in accordance with EN 12698-1 is needed.

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PUBLISHED
SSH EN 12698-2:2007
60.60 Standard published
Oct 24, 2011

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Adopted from EN 12698-2:2007

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