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SSH EN 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Dec 18, 2006
95.99 Withdrawal of Standard   Oct 30, 2025

General information

95.99     Oct 30, 2025

DPS

DPS/KT 4

European Norm

31.080.01  

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Scope

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-10:2002
95.99 Withdrawal of Standard
Oct 30, 2025

REVISED BY

PUBLISHED
SSH EN IEC 60749-10:2022

Related project

Adopted from EN 60749-10:2002

Adopted from IEC 60749-10 Ed. 1.0 b