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SSH EN 60749-13:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Dec 18, 2006
95.99 Withdrawal of Standard   Apr 19, 2023

General information

95.99     Apr 19, 2023

DPS

DPS/KT 4

European Norm

31.080.01  

English  

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Scope

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-13:2002
95.99 Withdrawal of Standard
Apr 19, 2023

REVISED BY

PUBLISHED
SSH EN IEC 60749-13:2018

Related project

Adopted from EN 60749-13:2002

Adopted from IEC 60749-13 Ed. 1.0 b