SSH EN 12544-2:2000

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2: Constancy check by the thick filter method

Publication date: Dec 29, 2006

General information

Current stage: 60.60 Effective date: Dec 29, 2006

Originator: DPS

Owner: DPS/KT 47

Type: European Norm

ICS: 19.100

Languages: English

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Status: Published

PDF - ALL 2,261

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CD - ALL 2,261

PDF and Paper - ALL 4,522

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Scope

This standard specifies a constancy check of a X-ray system where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which can be changing due to ageing of the tube. The thick filter method is based on a measurement of the dose rate behind a defined thick filter using defined distances between the X-ray tube, the filter and the measuring device. This method is very sensitive to changes of the voltage, but it does not provide an absolute value for the X-ray tube voltage.

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PUBLISHED
SSH EN 12544-2:2000
60.60 Standard published
Dec 29, 2006

Related project

Adopted from EN 12544-2:2000

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