SSH EN 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Publication date: Aug 30, 2006

General information

Current stage: 60.60 Effective date: Jan 1, 2006

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.200

Languages: English

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Status: Published

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Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.

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PUBLISHED
SSH EN 61967-6:2002
60.60 Standard published
Jan 1, 2006

SSH EN 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

General information

Buying

Scope

Life cycle

NOW

Related project

Adopted from EN 61967-6:2002

Adopted from IEC 61967-6 Ed. 1.0 b