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SSH EN 61967-1:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions

Aug 30, 2006
95.99 Withdrawal of Standard   Mar 10, 2025

General information

95.99     Mar 10, 2025

DPS

DPS/KT 4

European Norm

31.200  

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Scope

Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

Life cycle

NOW

WITHDRAWN
SSH EN 61967-1:2002
95.99 Withdrawal of Standard
Mar 10, 2025

REVISED BY

PUBLISHED
SSH EN IEC 61967-1:2019

Related project

Adopted from EN 61967-1:2002

Adopted from IEC 61967-1 Ed. 1.0 b