Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
WITHDRAWN
SSH EN 61967-4:2002
95.99
Withdrawal of Standard
Mar 10, 2025
PUBLISHED
SSH EN IEC 61967-4:2021