SSH EN 60749-34:2004

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Publication date: Aug 30, 2006

95.99 Withdrawal of Standard Mar 4, 2014

General information

Current stage: 95.99 Effective date: Mar 4, 2014

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080

Languages: English

Buying

Status: Withdrawn

PDF - ALL 2,261

Paper - ALL 2,261

CD - ALL 2,261

PDF and Paper - ALL 4,522

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Scope

Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-34:2004
95.99 Withdrawal of Standard
Mar 4, 2014

REVISED BY

PUBLISHED
SSH EN 60749-34:2010

SSH EN 60749-34:2004

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

95.99 Withdrawal of Standard Mar 4, 2014

General information

Buying

Scope

Life cycle

NOW

REVISED BY

Related project

Adopted from EN 60749-34:2004