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SSH EN 60749-33:2004

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

Aug 30, 2006

General information

60.60     Jan 1, 2004

DPS

DPS/KT 4

European Norm

31.080  

English  

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Scope

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

Life cycle

NOW

PUBLISHED
SSH EN 60749-33:2004
60.60 Standard published
Jan 1, 2004

Related project

Adopted from EN 60749-33:2004

Adopted from IEC 60749-33 Ed. 1.0 b

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