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Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
60.60 Standard published
Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
60.60 Standard published
Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
60.60 Standard published
Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
60.60 Standard published
Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
60.60 Standard published
Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
60.60 Standard published
Semiconductor devices - Part 6: Discrete devices - Thyristors
60.60 Standard published
Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
60.60 Standard published
Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
60.60 Standard published
Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 1: General
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
60.60 Standard published
Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
60.60 Standard published
Amendment 2 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
60.60 Standard published
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