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Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
60.60 Standard published
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
60.60 Standard published
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
60.60 Standard published
Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
60.60 Standard published
Semiconductor devices - Part 3: Discrete devices: Signal, switching and regulator diodes
60.60 Standard published
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
60.60 Standard published
Amendment 1 - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
60.60 Standard published
Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point
60.60 Standard published
Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
60.60 Standard published
Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
60.60 Standard published
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
60.60 Standard published
Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
60.60 Standard published
Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
60.60 Standard published
Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
60.60 Standard published
Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
60.60 Standard published
Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 1: General
60.60 Standard published
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
60.60 Standard published
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