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Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices
40.00 DIS registered
Semiconductor devices - Detection modules of autonomous land vehicle - Part 1:Testing methods of detection performance for LiDAR
30.60 Close of voting/ comment period
Semiconductor devices - Detection modules of autonomous land vehicle - Part 5: Testing methods of performance for ultrasonic modules
20.99 WD approved for registration as CD
Semiconductor devices - Detection modules of autonomous land vehicle - Part 6: Testing methods of performance for visual imaging modules
20.99 WD approved for registration as CD
Fully flexible Organic Light Emitting Diode (OLED) panels for general lighting - Performance requirements
40.20 DIS ballot initiated: 12 weeks
LED Light sources – Performance requirements
40.99 Full report circulated: DIS approved for registration as FDIS
Coupled-stress acceleration test sequence for photovoltaic modules and materials
30.20 CD study/ballot initiated
Power Electronic Converters part of Distributed Energy Resources (DER) - Test methods and guidance for assessment of functional requirements related to safety and power quality
20.99 WD approved for registration as CD
Concentric lay overhead electrical stranded conductors
30.20 CD study/ballot initiated
Excimer sources for germicidal purpose - Safety specifications
30.20 CD study/ballot initiated
Measurement of ozone production from UV-C radiation sources and luminaires
20.99 WD approved for registration as CD
Germicidal equipment - Low-pressure mercury UV radiation sources for germicidal purpose - Safety specifications
30.99 CD approved for registration as DIS
Electrical safety of Snow melting photovoltaic (Snow PV) module - Requirements for construction and testing
40.99 Full report circulated: DIS approved for registration as FDIS
Visual comfort of display terminals - Part 1: Introduction
40.99 Full report circulated: DIS approved for registration as FDIS
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
30.99 CD approved for registration as DIS
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
20.99 WD approved for registration as CD
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