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Polyvinyl chloride insulated cables of rated voltages up to and including 450/750 V - Part 6: Lift cables and cables for flexible connections
40.60 Close of voting
Polyvinyl chloride insulated cables of rated voltages up to and including 450/750 V - Part 7: Flexible cables screened and unscreened with two or more conductors
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Amendment 1 - Polyvinyl chloride insulated cables of rated voltages up to and including 450/750 V - Part 7: Flexible cables screened and unscreened with two or more conductors
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Amendment 2 - Polyvinyl chloride insulated cables of rated voltages up to and including 450/750 V - Part 7: Flexible cables screened and unscreened with two or more conductors
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Magnetic materials - Part 8-3: Specifications for individual materials - Cold-rolled non-oriented electrical steel strip and sheet delivered in the semi-processed state
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Power cables with extruded insulation and their accessories for rated voltages from 1 kV (Um = 1,2 kV) up to 30 kV (Um = 36 kV) - Part 4: Test requirements on accessories for cables with rated voltages from 6 kV (Um = 7,2 kV) up to 30 kV (Um = 36 kV)
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Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
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Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
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Semiconductor devices – Part 18-4: Semiconductor bio sensors – Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
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Semiconductor devices – Part 18-5: Semiconductor bio sensors – Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
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Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method
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Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy
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Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the photocurrent spectroscopy
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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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Fixed inductors for electromagnetic interference suppression - Part 2-1: Blank detail specification - Inductors for which safety tests are required - Assessment level D
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Varistors for use in electronic equipment - Part 2: Blank detail specification for zinc oxide surge suppression varistors. Assessment level E
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-11: Tests - Axial compression
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-6: Tests - Tensile strength of coupling mechanism
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