ISO/PWI 25836

Microbeam analysis – Analytical electron microscope - Phase identification of metals and oxides by precession electron diffraction

Scope

This document specifies the use of Precession Electron Diffraction (PED) technology on the phase identification of metals and its oxides. It encompasses the establishment of definitive criteria for sample preparation, experimental parameterization, data acquisition protocols, and methods for phase identification. The document is designed to ensure thatthe application of PED technology yields data of high scientific integrity, enabling crosslaboratory comparability and the reproducibility of results within the materials science community. This document delineates the technical requirements for the preparation of specimens suitable for PED analysis. It prescribes the adequate experimental parameters, such as electron beam acceleration voltage, precession angle, and exposure time, which are critical for the acquisition of high-resolution diffraction data. Moreover, this document specifies the procedures for data processing and phase analysis. By adhering to these standardized protocols, researchers are equipped to conduct PED analyses that yield consistent and scientifically valid phase identification outcomes.