DPS
Drejtoria e Përgjithshme e Standardizimit

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ISO/WD 25797

Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for determining amount-of-substance of deposited materials and physical film thickness by using X-ray fluorescence spectrometry

General information

Current stage: 20.60 Effective date: Sep 9, 2025

Originator: ISO

Owner: ISO/TC 206

Type: International Standard

Scope

This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.

Life cycle

NOW

IN_DEVELOPMENT
ISO/WD 25797
20.60 Close of comment period
Sep 9, 2025