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ISO/CD 25797

Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for determining amount-of-substance of deposited materials and physical film thickness by using X-ray fluorescence spectrometry

General information

30.20     Jul 28, 2026

ISO

ISO/TC 206

International Standard

Scope

This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.

Life cycle

NOW

IN_DEVELOPMENT
ISO/CD 25797
30.20 CD study/ballot initiated
Jul 28, 2026

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