30.20 Jul 6, 2026
ISO
ISO/TC 202/SC 3
International Standard
This document specifies procedures for the measurement of dislocation density in thin metals by using transmission electron microscope. This document applies to measure the dislocation density lower than 11015m-2. This document applies to analyse the dislocations in a single grain of the thin metals’ specimen with the thickness between tens to hundreds of nanometers.
IN_DEVELOPMENT
ISO/CD 13139
30.20
CD study/ballot initiated
Jul 6, 2026
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