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ISO 24173:2024

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

Feb 9, 2024

General information

60.60     Feb 9, 2024

ISO

ISO/TC 202

International Standard

71.040.50  

English  

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Scope

This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 24173:2009

NOW

PUBLISHED
ISO 24173:2024
60.60 Standard published
Feb 9, 2024